Atomic structure of highly strained BiFeO3 thin films

We determine the atomic structure of the pseudotetragonal T phase and the pseudorhombohedral R phase in highly strained multiferroic BiFeO(3) thin films by using a combination of atomic-resolution scanning transmission electron microscopy and electron energy-loss spectroscopy. The coordination of th...

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Bibliographic Details
Published in:Physical review letters 2012-01, Vol.108 (4), p.047601-047601
Main Authors: Rossell, M D, Erni, R, Prange, M P, Idrobo, J-C, Luo, W, Zeches, R J, Pantelides, S T, Ramesh, R
Format: Article
Language:English
Subjects:
ATOMS
BFO
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
eels
ELECTRONIC STRUCTURE
ELECTRONS
ENERGY-LOSS SPECTROSCOPY
POLARIZATION
STEM
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
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Summary:We determine the atomic structure of the pseudotetragonal T phase and the pseudorhombohedral R phase in highly strained multiferroic BiFeO(3) thin films by using a combination of atomic-resolution scanning transmission electron microscopy and electron energy-loss spectroscopy. The coordination of the Fe atoms and their displacement relative to the O and Bi positions are assessed by direct imaging. These observations allow us to interpret the electronic structure data derived from electron energy-loss spectroscopy and provide evidence for the giant spontaneous polarization in strained BiFeO(3) thin films.
ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.108.047601