Similarities between Ionizing Radiation Effects and Negative-Bias Temperature Instability (NBTI) in MOSFET Devices

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Bibliographic Details
Main Authors: Hjalmarson, Harold Paul, D. D. Nguyen, K. E. Kambour, C. Kouhestani, R. A. B. Devine
Format: Conference Proceeding
Language:English
Online Access:Get full text
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ISSN:1938-6737
1938-6737
DOI:10.1149/05807.0049ecst