Optical design of the NSLS-II metrology beamline

The article describes the optical design of the NSLS-II test beamline, dedicated to at-wavelength metrology, in situ surface figuring, crystal optics, radiometry, detectors and instrumentation testing. A key aspect of the beamline design is configuration flexibility, providing as wide as possible ra...

Full description

Saved in:
Bibliographic Details
Published in:Journal of physics. Conference series 2013-03, Vol.425 (16), p.162009-4
Main Authors: Kaznatcheev, K, Chubar, O, Keister, J W, Idir, M
Format: Article
Language:English
Subjects:
Coherence
Configuration management
Crystal optics
Filtering
Flux
MATERIALS SCIENCE
Metrology
Optical design
Particle beams
Particle physics
Photon beams
Physics
Radiometry
Refractive lenses
Soft x rays
Zone plates
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The article describes the optical design of the NSLS-II test beamline, dedicated to at-wavelength metrology, in situ surface figuring, crystal optics, radiometry, detectors and instrumentation testing. A key aspect of the beamline design is configuration flexibility, providing as wide as possible range of photon energy, beam size, and divergence, including the optimum trading of SR flux to a required degree of coherence. For this application we propose to use the chromatic properties of compound refractive lens (for hard x-ray) or zone plate (for soft x-ray) to provide band-pass energy filtering and variable spatial coherence. Using such a scheme, it is possible to efficiently vary the transverse coherence from 10 μm to 10 mm at ~1% monochromaticity. The flux extracted permits real-time phase imaging and at-wavelength metrology, even at the bending magnet beamline.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/425/16/162009