Effect of domain structure on dielectric nonlinearity in epitaxial BiFeO3 films

Rayleigh analysis has been used to investigate dielectric nonlinearity in epitaxial (001)-oriented BiFeO3 films with engineered domain structures from single- to four-variant and stripe domain samples with 71° and 109° domain walls. Single-domain variant films display minimal irreversible contributi...

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Bibliographic Details
Published in:Applied physics letters 2010-12, Vol.97 (26)
Main Authors: Ihlefeld, J. F., Folkman, C. M., Baek, S. H., Brennecka, G. L., George, M. C., Carroll, J. F., Eom, C. B.
Format: Article
Language:English
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Summary:Rayleigh analysis has been used to investigate dielectric nonlinearity in epitaxial (001)-oriented BiFeO3 films with engineered domain structures from single- to four-variant and stripe domain samples with 71° and 109° domain walls. Single-domain variant films display minimal irreversible contributions, whereas the ratio of irreversible to reversible contributions increases by approximately one order of magnitude as the number of variants increases to two- and four-variants, respectively. These measurements indicate that the density of domain walls and degree of domain wall complexity influence the number and strength of domain wall pinning sites.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.3533017