Comparison of Analog and Digital Readout Electronics on the Processing of Charge-Sharing Events in Pixelated CdZnTe Detectors

We present our results from testing 15×15×10 mm 3 CdZnTe pixelated detectors using a readout system based on the H3D ASIC. Data obtained with an uncollimated 137 Cs source helped reveal details of the operational principle of such devices, and how the pulse-processing electronics may influence their...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 2014-04, Vol.61 (2), p.787-792
Main Authors: Bolotnikov, A. E., Bale, D., Butcher, J., Camarda, G. S., Cui, Y., De Geronimo, G., Fried, J., Hossain, A., Kim, K. H., Marshall, M., Soldner, S., Petryk, M., Prokesch, M., Vernon, E., Yang, G., James, R. B.
Format: Article
Language:English
Subjects:
Anodes
Application specific integrated circuits
ASICs
CdZnTe
Correlation
crystal defects
CZT detectors
Detectors
Image quality
Readout electronics
Transient analysis
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Summary:We present our results from testing 15×15×10 mm 3 CdZnTe pixelated detectors using a readout system based on the H3D ASIC. Data obtained with an uncollimated 137 Cs source helped reveal details of the operational principle of such devices, and how the pulse-processing electronics may influence their performance. The responses of individual pixels were compared by using two different pulse processing approaches based on the analog shaping (H3D ASIC) and fitting of the waveforms as read out from hybrid preamplifiers.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2014.2299493