Evaluation of CdTexSe1−x crystals grown from a Te-rich solution

We characterized the structural quality of CdTexSe1−x crystals grown by the Traveling Heater Method (THM) from a Te-rich solution using Synchrotron White Beam X-ray Diffraction Topography in the reflection mode. Structural defects were also studied by chemical etching of the crystal surfaces. The cr...

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Bibliographic Details
Published in:Journal of crystal growth 2014-03, Vol.389, p.99-102
Main Authors: Roy, U.N., Bolotnikov, A.E., Camarda, G.S., Cui, Y., Hossain, A., Lee, K., Yang, G., James, R.B.
Format: Article
Language:English
Subjects:
A1. Characterization
A1. Extended defects
A1. Sub-grain boundary network
A2. THM
B2. CdTeSe
B2. Semiconducting II–VI materials
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Defects and impurities in crystals
microstructure
Exact sciences and technology
Grain and twin boundaries
Growth from melts
zone melting and refining
Linear defects: dislocations, disclinations
Materials science
Methods of crystal growth
physics of crystal growth
Physics
Structure of solids and liquids
crystallography
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Summary:We characterized the structural quality of CdTexSe1−x crystals grown by the Traveling Heater Method (THM) from a Te-rich solution using Synchrotron White Beam X-ray Diffraction Topography in the reflection mode. Structural defects were also studied by chemical etching of the crystal surfaces. The crystals were found to be fairly free from strains, and they had very few sub-grain boundaries and dislocation/sub-grain boundary networks. •CdTeSe grown by the Traveling Heater Method.•Low concentration of sub-grain boundaries.•Absence of sub-grain boundary network.
ISSN:0022-0248
1873-5002
DOI:10.1016/j.jcrysgro.2013.11.074