X-ray Irradiation Induced Reversible Resistance Change in Pt/TiO 2 /Pt Cells

The interaction between X-rays and matter is an intriguing topic for both fundamental science and possible applications. In particular, synchrotron-based brilliant X-ray beams have been used as a powerful diagnostic tool to unveil nanoscale phenomena in functional materials. But, it has not been wid...

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Bibliographic Details
Published in:ACS nano 2014-02, Vol.8 (2), p.1584-1589
Main Authors: Chang, Seo Hyoung, Kim, Jungho, Phatak, Charudatta, D’Aquila, Kenneth, Kim, Seong Keun, Kim, Jiyoon, Song, Seul Ji, Hwang, Cheol Seong, Eastman, Jeffrey A., Freeland, John W., Hong, Seungbum
Format: Article
Language:English
Subjects:
defect generation
Joule heating
Magnéli phase
MATERIALS SCIENCE
photovoltaic effect
resistive switching
X-ray irradiation
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Summary:The interaction between X-rays and matter is an intriguing topic for both fundamental science and possible applications. In particular, synchrotron-based brilliant X-ray beams have been used as a powerful diagnostic tool to unveil nanoscale phenomena in functional materials. But, it has not been widely investigated how functional materials respond to the brilliant X-rays. Here, we report the X-ray-induced reversible resistance change in 40-nm-thick TiO2 films sandwiched by Pt top and bottom electrodes, and propose the physical mechanism behind the emergent phenomenon. Our findings indicate that there exists a photovoltaic-like effect, which modulates the resistance reversibly by a few orders of magnitude, depending on the intensity of impinging X-rays. Furthermore, we found that this effect, combined with the X-ray irradiation induced phase transition confirmed by transmission electron microscopy, triggers a nonvolatile reversible resistance change. In understanding X-ray-controlled reversible resistance changes we can provide possibilities to control initial resistance states of functional materials, which could be useful for future information and energy storage devices.
ISSN:1936-0851
1936-086X
DOI:10.1021/nn405867p