Vacancy compensation and related donor-acceptor pair recombination in bulk AlN

A prominent 2.8 eV emission peak is identified in bulk AlN substrates grown by physical vapor transport. This peak is shown to be related to the carbon concentration in the samples. Density functional theory calculations predict that this emission is caused by a donor-acceptor pair (DAP) recombinati...

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Bibliographic Details
Published in:Applied physics letters 2013-10, Vol.103 (16)
Main Authors: Gaddy, Benjamin E., Bryan, Zachary, Bryan, Isaac, Kirste, Ronny, Xie, Jinqiao, Dalmau, Rafael, Moody, Baxter, Kumagai, Yoshinao, Nagashima, Toru, Kubota, Yuki, Kinoshita, Toru, Koukitu, Akinori, Sitar, Zlatko, Collazo, Ramón, Irving, Douglas L.
Format: Article
Language:English
Subjects:
Aluminum nitride
Carbon
Density functional theory
Emission
Emission spectroscopy
Mathematical models
Photoluminescence
Vacancies
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Summary:A prominent 2.8 eV emission peak is identified in bulk AlN substrates grown by physical vapor transport. This peak is shown to be related to the carbon concentration in the samples. Density functional theory calculations predict that this emission is caused by a donor-acceptor pair (DAP) recombination between substitutional carbon on the nitrogen site and a nitrogen vacancy. Photoluminescence and photoluminescence-excitation spectroscopy are used to confirm the model and indicate the DAP character of the emission. The interaction between defects provides a pathway to creating ultraviolet-transparent AlN substrates for optoelectronics applications.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4824731