Curvature-induced and thermal strain in polyhedral gold nanocrystals

We use coherent x-ray diffractive imaging to map the local distribution of strain in gold (Au) polyhedral nanocrystals grown on a silicon (Si) substrate by a single-step thermal chemical vapor deposition process. The lattice strain at the surface of the octahedral nanocrystal agrees well with the pr...

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Bibliographic Details
Published in:Applied physics letters 2014-10, Vol.105 (17)
Main Authors: Kim, J. W., Manna, S., Dietze, S. H., Ulvestad, A., Harder, R., Fohtung, E., Fullerton, E. E., Shpyrko, O. G.
Format: Article
Language:English
Subjects:
MATERIALS SCIENCE
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Summary:We use coherent x-ray diffractive imaging to map the local distribution of strain in gold (Au) polyhedral nanocrystals grown on a silicon (Si) substrate by a single-step thermal chemical vapor deposition process. The lattice strain at the surface of the octahedral nanocrystal agrees well with the predictions of the Young-Laplace equation quantitatively, but exhibits a discrepancy near the nanocrystal-substrate interface. We attribute this discrepancy to the dissimilar interfacial energies between Au/Air and Au/Si and to the difference in thermal expansion between the nanocrystal and the substrate during the cooling process.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4900866