A Seeman-Bohlin geometry for high-resolution nanosecond x-ray diffraction measurements from shocked polycrystalline and amorphous materials

We report on a focusing x-ray diffraction geometry capable of high-resolution in situ lattice probing from dynamically loaded polycrystalline and amorphous materials. The Seeman-Bohlin-type camera presented here is ideally suited for time-resolved x-ray diffraction measurements performed on high ene...

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Bibliographic Details
Published in:Review of scientific instruments 2009-09, Vol.80 (9), p.093904-093904
Main Authors: Milathianaki, D, Hawreliak, J, McNaney, J M, El-Dasher, B S, Saculla, M D, Swift, D C, Lorenzana, H E, Ditmire, T
Format: Article
Language:English
Subjects:
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
MATERIALS SCIENCE
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Summary:We report on a focusing x-ray diffraction geometry capable of high-resolution in situ lattice probing from dynamically loaded polycrystalline and amorphous materials. The Seeman-Bohlin-type camera presented here is ideally suited for time-resolved x-ray diffraction measurements performed on high energy multibeam laser platforms. Diffraction from several lattice planes of ablatively shock-loaded 25 mum thick Cu foils was recorded on a focusing circle of diameter D=100 mm with exceptional angular resolution limited only by the spectral broadening of the x-ray source. Excellent agreement was found between the density measured using x-ray diffraction and that inferred from Doppler velocimetry and the known shock Hugoniot of Cu. In addition, x-ray diffraction signal was captured from an amorphous material under static conditions.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.3230647