Dissociative electron attachment in nanoscale ice films: Thickness and charge trapping effects

The yield and kinetic energy (KE) distributions of D− ions produced via dissociative electron attachment (DEA) resonances in nanoscale D2O ice films are collected as a function of film thickness. The B12, A12, and B22 DEA resonances shift to higher energies and their D− ion yields first increase and...

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Bibliographic Details
Published in:The Journal of chemical physics 1998-03, Vol.108 (12), p.5027-5034
Main Authors: Simpson, W. C., Orlando, T. M., Parenteau, L., Nagesha, K., Sanche, L.
Format: Article
Language:English
Subjects:
INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
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Summary:The yield and kinetic energy (KE) distributions of D− ions produced via dissociative electron attachment (DEA) resonances in nanoscale D2O ice films are collected as a function of film thickness. The B12, A12, and B22 DEA resonances shift to higher energies and their D− ion yields first increase and then decrease as the D2O films thicken. The D− KE distributions also shift to higher energy with increasing film thickness. We interpret the changes in the DEA yield and the D− KE distributions in terms of modifications in the electronic and geometric structure of the surface of the film as it thickens. A small amount of charge build-up occurs following prolonged electron beam exposure at certain energies, which primarily affects the D− KE distributions. Charge trapping measurements indicate that an enhancement in the trapping cross section occurs at energies near zero and between 6 and 10 eV.
ISSN:0021-9606
1089-7690
DOI:10.1063/1.475924