High-resolution X-ray diffraction beamline at the LNLS for the study of charge, orbital and magnetic structures

• Published in: Journal of synchrotron radiation 2003-11, Vol.10 (6), p.430-434
• Main Authors: Giles, C., Yokaichiya, F., Kycia, S. W., Sampaio, L. C., Ardiles-Saravia, D. C., Franco, M. K. K., Neuenschwander, R. T.
• Format: Article
• Language: English
• Subjects: ACCELERATOR FACILITIES; beamline optics; Brazil; Equipment Design; Equipment Failure Analysis; Holmium - chemistry; instrumentation; Laboratories; LNLS STORAGE RING; Magnetics; MATERIALS TESTING; NATIONAL SYNCHROTRON LIGHT SOURCE; Nickel - chemistry; PARTICLE ACCELERATORS; Reproducibility of Results; Scattering, Radiation; Sensitivity and Specificity; Static Electricity; Synchrotrons - instrumentation; Temperature; X-RAY DIFFRACTION; X-Ray Diffraction - instrumentation; X-Ray Diffraction - methods; X-ray magnetic scattering
• ISSN: 1600-5775; 0909-0495; 1600-5775
• DOI: 10.1107/S0909049503020958

A high‐resolution X‐ray diffraction beamline at the Brazilian Synchrotron Light Laboratory (LNLS) has been commissioned for the study of crystalline magnetic materials. The beamline optics is based on a Rh‐coated vertical‐focusing X‐ray mirror and a sagittal‐focusing double‐crystal monochromator. The primary instrument is a six‐circle diffractometer equipped with energy and polarization analysers and a closed‐cycle He cryostat. The beamline source is a bending magnet of the 1.37 GeV storage ring of the LNLS, delivering approximately 4 × 1010 photons s−1 at 8 keV at the sample position. Resonant and non‐resonant scattering are the main techniques used to study charge, orbital and magnetic structures. Examples of magnetic scattering in Ho and NiO single crystals, as well as orbital ordering in manganites thin films, are presented.