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Supercontinuum-laser diffuse reflectance spectroscopy in conjunction with an extended Kubelka-Munk model-a methodology for determination of temperature-dependent quantum efficiency in highly scattering and fluorescent media
Temperature-dependent diffuse reflectance measurements on Cr-doped -alumina monoliths have been performed using supercontinuum-laser illumination and -laser heating. These measurements have been interpreted using an extended Kubelka-Munk (K-M) model describing diffuse-light propagation in highly sca...
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Published in: | Applied optics (2004) 2019-04, Vol.58 (10), p.2438 |
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container_issue | 10 |
container_start_page | 2438 |
container_title | Applied optics (2004) |
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creator | Brupbacher, Michael C Zhang, Dajie Buchta, William M Airola, Marc B Brown, David M Thomas, Michael E Spicer, James B |
description | Temperature-dependent diffuse reflectance measurements on Cr-doped
-alumina monoliths have been performed using supercontinuum-laser illumination and
-laser heating. These measurements have been interpreted using an extended Kubelka-Munk (K-M) model describing diffuse-light propagation in highly scattering and fluorescent media to assess the temperature dependence of fluorescence quantum efficiency. Analysis of experimental results has provided a qualitative understanding of the temperature-dependent conditions for model applicability and also suggests methods for using supercontinuum-laser diffuse reflectance spectroscopy for detection of unknown fluorescent dopants. |
doi_str_mv | 10.1364/AO.58.002438 |
format | article |
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-alumina monoliths have been performed using supercontinuum-laser illumination and
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-alumina monoliths have been performed using supercontinuum-laser illumination and
-laser heating. These measurements have been interpreted using an extended Kubelka-Munk (K-M) model describing diffuse-light propagation in highly scattering and fluorescent media to assess the temperature dependence of fluorescence quantum efficiency. Analysis of experimental results has provided a qualitative understanding of the temperature-dependent conditions for model applicability and also suggests methods for using supercontinuum-laser diffuse reflectance spectroscopy for detection of unknown fluorescent dopants.</description><subject>Aluminum oxide</subject><subject>Diffuse reflectance spectroscopy</subject><subject>Fluorescence</subject><subject>Laser beam heating</subject><subject>Lasers</subject><subject>Light</subject><subject>Nickel</subject><subject>Qualitative analysis</subject><subject>Quantum efficiency</subject><subject>Scattering</subject><subject>Spectrum analysis</subject><subject>Temperature dependence</subject><issn>1559-128X</issn><issn>2155-3165</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNo9kU9v1DAQxS0EokvhxhlZcG0WO3YS57iqoCCK9gBI3CKvPd54m9ip_wj20_JV8HYLJ4-l37yZeQ-h15SsKWv5-8123Yg1ITVn4gla1bRpKkbb5ilalbKvaC1-XqAXMR4IYQ3vu-foglHCm_JboT_f8gJBeZesy3muJhkhYG2NyRFwADOBStIpwHEpVfBR-eWIrcOl55CdStY7_MumEUuH4XcCp0HjL3kH052svmZ3h2evYaokniGNXvvJ74_Y-DIFEoTZOvmg4Q1OMJdlZMoBKg3LScolfJ-lS3nGYIxVFpx6GD_a_TgdcVQyFRXr9mW-xmbKPkBUp74ZtJUv0TMjpwivHt9L9OPjh-_Xn6rb7c3n681tpZjgqeJa73pOSN8RI3ktWN_20LGOS9ky0QreE9I1rCE9h1ppBYJxQQ0FYNBRxtklenvW9THZISqbQI3FIldMG2hDaN_WBXp3hpbg7zPENBx8Dq7sNdQ1bUVX8uoKdXWmVHE7lgiGJdhZhuNAyXCKfNhsh0YM58gL_uZRNO_Kyf_hfxmzvx8UrIE</recordid><startdate>20190401</startdate><enddate>20190401</enddate><creator>Brupbacher, Michael C</creator><creator>Zhang, Dajie</creator><creator>Buchta, William M</creator><creator>Airola, Marc B</creator><creator>Brown, David M</creator><creator>Thomas, Michael E</creator><creator>Spicer, James B</creator><general>Optical Society of America</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>OTOTI</scope><orcidid>https://orcid.org/0000-0002-4821-090X</orcidid><orcidid>https://orcid.org/000000024821090X</orcidid></search><sort><creationdate>20190401</creationdate><title>Supercontinuum-laser diffuse reflectance spectroscopy in conjunction with an extended Kubelka-Munk model-a methodology for determination of temperature-dependent quantum efficiency in highly scattering and fluorescent media</title><author>Brupbacher, Michael C ; Zhang, Dajie ; Buchta, William M ; Airola, Marc B ; Brown, David M ; Thomas, Michael E ; Spicer, James B</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c384t-4ddb9400970fa4283969e7374aa6386849007535094e2cdce83481f1ee3e71343</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Aluminum oxide</topic><topic>Diffuse reflectance spectroscopy</topic><topic>Fluorescence</topic><topic>Laser beam heating</topic><topic>Lasers</topic><topic>Light</topic><topic>Nickel</topic><topic>Qualitative analysis</topic><topic>Quantum efficiency</topic><topic>Scattering</topic><topic>Spectrum analysis</topic><topic>Temperature dependence</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Brupbacher, Michael C</creatorcontrib><creatorcontrib>Zhang, Dajie</creatorcontrib><creatorcontrib>Buchta, William M</creatorcontrib><creatorcontrib>Airola, Marc B</creatorcontrib><creatorcontrib>Brown, David M</creatorcontrib><creatorcontrib>Thomas, Michael E</creatorcontrib><creatorcontrib>Spicer, James B</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV</collection><jtitle>Applied optics (2004)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Brupbacher, Michael C</au><au>Zhang, Dajie</au><au>Buchta, William M</au><au>Airola, Marc B</au><au>Brown, David M</au><au>Thomas, Michael E</au><au>Spicer, James B</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Supercontinuum-laser diffuse reflectance spectroscopy in conjunction with an extended Kubelka-Munk model-a methodology for determination of temperature-dependent quantum efficiency in highly scattering and fluorescent media</atitle><jtitle>Applied optics (2004)</jtitle><addtitle>Appl Opt</addtitle><date>2019-04-01</date><risdate>2019</risdate><volume>58</volume><issue>10</issue><spage>2438</spage><pages>2438-</pages><issn>1559-128X</issn><eissn>2155-3165</eissn><abstract>Temperature-dependent diffuse reflectance measurements on Cr-doped
-alumina monoliths have been performed using supercontinuum-laser illumination and
-laser heating. These measurements have been interpreted using an extended Kubelka-Munk (K-M) model describing diffuse-light propagation in highly scattering and fluorescent media to assess the temperature dependence of fluorescence quantum efficiency. Analysis of experimental results has provided a qualitative understanding of the temperature-dependent conditions for model applicability and also suggests methods for using supercontinuum-laser diffuse reflectance spectroscopy for detection of unknown fluorescent dopants.</abstract><cop>United States</cop><pub>Optical Society of America</pub><pmid>31045035</pmid><doi>10.1364/AO.58.002438</doi><orcidid>https://orcid.org/0000-0002-4821-090X</orcidid><orcidid>https://orcid.org/000000024821090X</orcidid><oa>free_for_read</oa></addata></record> |
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language | eng |
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source | Optica Publishing Group (OPG) |
subjects | Aluminum oxide Diffuse reflectance spectroscopy Fluorescence Laser beam heating Lasers Light Nickel Qualitative analysis Quantum efficiency Scattering Spectrum analysis Temperature dependence |
title | Supercontinuum-laser diffuse reflectance spectroscopy in conjunction with an extended Kubelka-Munk model-a methodology for determination of temperature-dependent quantum efficiency in highly scattering and fluorescent media |
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