Diagnosis of factors impacting yield in multilayer devices for superconducting electronics

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Bibliographic Details
Main Authors: Missert, Nancy A., Jenkins, Mark W., Tangyunyong, Paiboon, Mook, William, Vernik, I., Kirichenko, A., Mukhanov, O., Wynn, A., Day, A. L., Bolkhovsky, V., Johnson, L.
Format: Conference Proceeding
Language:English
Online Access:Get full text
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ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2019.2908052