The 4D Camera: Very High Speed Electron Counting for 4D-STEM

A vast array of new experimental modalities have been enabled in the past several years through the development of pixelated detectors synchronized to probe scanning electronics. Such camera systems can then acquire the rich information present in the central portion of the convergent beam electron...

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Bibliographic Details
Published in:Microscopy and microanalysis 2019-08, Vol.25 (S2), p.1930-1931
Main Authors: Ciston, Jim, Johnson, Ian J., Draney, Brent R., Ercius, Peter, Fong, Erin, Goldschmidt, Azriel, Joseph, John M., Lee, Jason R., Mueller, Alexander, Ophus, Colin, Selvarajan, Ashwin, Skinner, David E., Stezelberger, Thorsten, Tindall, Craig S., Minor, Andrew M., Denes, Peter
Format: Article
Language:English
Subjects:
Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
OTHER INSTRUMENTATION
Physical Science Symposia
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Summary:A vast array of new experimental modalities have been enabled in the past several years through the development of pixelated detectors synchronized to probe scanning electronics. Such camera systems can then acquire the rich information present in the central portion of the convergent beam electron diffraction pattern as a function of probe position (4D-STEM). Here, we present the development, installation, and characterization of the 4D Camera, a CMOS Active Pixel Sensor that consists of a 576 x 576 array of 10 μm pixels of a design related to the original TEAM detector and an outer HAADF detector with 16 concentric quadrant diodes.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927619010389