Approximation of the maximum frequency of operation for point-contact MIM diodes from DC current against voltage measurements

Point-contact metal–insulator–metal (MIM) diodes have been used for detection and mixing at frequencies as high as 520 THz. In detection, the current responsivity (CR), defined as the change in the DC current caused by an incremental change in the high-frequency input power, depends on the dimension...

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Bibliographic Details
Published in:Electronics letters 2015-04, Vol.51 (7), p.566-568
Main Authors: Snyder, G, Rhoades, C, Hagmann, M.J
Format: Article
Language:English
Subjects:
dc current
ICR
intrinsic current responsivity
Microwave technology
MIM devices
point‐contact metal‐insulator‐metal diodes
point‐contact MIM diodes
semiconductor diodes
test fixture
voltage measurements
Citations: Items that this one cites
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Description
Summary:Point-contact metal–insulator–metal (MIM) diodes have been used for detection and mixing at frequencies as high as 520 THz. In detection, the current responsivity (CR), defined as the change in the DC current caused by an incremental change in the high-frequency input power, depends on the dimensions of the diode and the test fixture. However, other researchers have shown that the intrinsic current responsivity (ICR) which sets an upper bound for the CR may be determined from DC current against voltage measurements. Additional calculations from DC measurements have been used to determine an upper bound for the maximum frequency of operation.
ISSN:0013-5194
1350-911X
1350-911X
DOI:10.1049/el.2014.4449