Wavelength-multiplexed single-shot ptychography

• Published in: Ultramicroscopy 2022-03, Vol.233 (C), p.113418-113418, Article 113418
• Main Authors: Barolak, Jonathan, Goldberger, David, Squier, Jeff, Bellouard, Yves, Durfee, Charles, Adams, Daniel
• Format: Article
• Language: English
• Subjects: Coherent diffraction imaging; Information multiplexing; Quantitative phase imaging; Reference-free; Single-shot ptychography
• ISSN: 0304-3991; 1879-2723
• DOI: 10.1016/j.ultramic.2021.113418

We present the first experimental demonstration of wavelength-multiplexing in single-shot ptychography. Specifically, we experimentally reconstruct the complex transmission profile of a wavelength-independent and wavelength-dependent object simultaneously for 532 nm and 633 nm probing wavelengths. In addition, we discuss the advantages of a more general approach to detector segmentation in single-shot ptychography. A minimization to correct for uncertainties in a priori information that is required for single-shot geometries is presented along with a novel probe constraint. Furthermore, this technique is complementary to dual-wavelength interferometry without the need for an external reference. This work is enabling to imaging technologies and applications such as broadband single-shot ptychography, time-resolved imaging by multiplexed ptychography, real-time inspection for laser micro-machining, and plasma imaging. •WM-SSP is a reference-free, multi-wavelength, phase/amplitude imaging method.•Experimental ptychographic wavelength multiplexing in a single-shot is presented.•DOE design and detector segmentation process for SSP is analyzed.•A minimization to correct for uncertainties in SSP specific information is presented.•A multi-wavelength probe constraint for the SSP optical setup is introduced.