Modulating Electron Beam–Sample Interactions in Imaging and Diffraction Modes by Dose Fractionation with Low Dose Rates

Technological opportunities are explored to enhance detection schemes in transmission electron microscopy (TEM) that build on the detection of single-electron scattering events across the typical spectrum of interdisciplinary applications. They range from imaging with high spatiotemporal resolution...

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Published in:Microscopy and microanalysis 2021-12, Vol.27 (6), p.1420-1430
Main Authors: Kisielowski, Christian, Specht, Petra, Rozeveld, Steven J., Kang, Joo, Fielitz, Alyssa J., Barton, David, Salazar, Anthony C., Dubon, Oscar D., Van Dyck, Dirk, Yancey, David F.
Format: Article
Language:English
Subjects:
beam–sample interactions
Coherence length
Coherent scattering
cryogenic electron microscopy (cryo-EM)
Crystals
Damage
Dosage
Elastic scattering
Electron beams
Energy dissipation
Energy loss
Excitation
Fractionation
high-resolution transmission electron microscopy (HRTEM)
inelastic electron scattering
Inelastic scattering
OTHER INSTRUMENTATION
Phonons
Quantum mechanics
Single electrons
Software and Instrumentation
temporal coherence
Transmission electron microscopy
Wave diffraction
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cited_by cdi_FETCH-LOGICAL-c387t-a6fdf4874e8e3d56c04abab3661e9c644831367ca5894bfb91cdb742accaf6a53
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creator Kisielowski, Christian
Specht, Petra
Rozeveld, Steven J.
Kang, Joo
Fielitz, Alyssa J.
Barton, David
Salazar, Anthony C.
Dubon, Oscar D.
Van Dyck, Dirk
Yancey, David F.
description Technological opportunities are explored to enhance detection schemes in transmission electron microscopy (TEM) that build on the detection of single-electron scattering events across the typical spectrum of interdisciplinary applications. They range from imaging with high spatiotemporal resolution to diffraction experiments at the window to quantum mechanics, where the wave-particle dualism of single electrons is evident. At the ultimate detection limit, where isolated electrons are delivered to interact with solids, we find that the beam current dominates damage processes instead of the deposited electron charge, which can be exploited to modify electron beam-induced sample alterations. The results are explained by assuming that all electron scattering are inelastic and include phonon excitation that can hardly be distinguished from elastic electron scattering. Consequently, a coherence length and a related coherence time exist that reflect the interaction of the electron with the sample and change linearly with energy loss. Phonon excitations are of small energy (
doi_str_mv 10.1017/S143192762101268X
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ispartof Microscopy and microanalysis, 2021-12, Vol.27 (6), p.1420-1430
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source Cambridge University Press
subjects beam–sample interactions
Coherence length
Coherent scattering
cryogenic electron microscopy (cryo-EM)
Crystals
Damage
Dosage
Elastic scattering
Electron beams
Energy dissipation
Energy loss
Excitation
Fractionation
high-resolution transmission electron microscopy (HRTEM)
inelastic electron scattering
Inelastic scattering
OTHER INSTRUMENTATION
Phonons
Quantum mechanics
Single electrons
Software and Instrumentation
temporal coherence
Transmission electron microscopy
Wave diffraction
title Modulating Electron Beam–Sample Interactions in Imaging and Diffraction Modes by Dose Fractionation with Low Dose Rates
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