Multiphysics modeling of SOFC performance degradation caused by interface delamination and active layer cracking

In solid oxide device operation, delamination and cracking cause more catastrophic damage to cell life than other degradation mechanisms, leading to more rapid cell failure. The electrochemical performance degradation caused by electrode/electrolyte interface delamination and active layer cracking w...

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Bibliographic Details
Published in:International journal of hydrogen energy 2022-12, Vol.47 (97), p.41124-41137
Main Authors: Yang, Tao, Fan, Yueying, Liu, Jian, Finklea, Harry, Lee, Shiwoo, Guan, Bo, Abernathy, Harry W., Kalapos, Thomas L., Hackett, Gregory A.
Format: Article
Language:English
Subjects:
Active layer cracking
Electrochemical impedance analysis
Interface delamination
Multiphysics simulation
Performance degradation
Solid oxide cell
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Summary:In solid oxide device operation, delamination and cracking cause more catastrophic damage to cell life than other degradation mechanisms, leading to more rapid cell failure. The electrochemical performance degradation caused by electrode/electrolyte interface delamination and active layer cracking were investigated through in-house developed three-dimensional multiphysics simulations. The multiphysics simulations, fully calibrated against experimental datasets for button cells in a previous study, were extended to quantitatively investigate the effects of electrode/electrolyte interface delamination and active layer cracking. The simulated polarization curves and impedance behavior with various levels of delamination and cracking provided insights of the performance degradation. Furthermore, the local current distributions within the cell were analyzed for three different operating modes: constant voltage, constant current, and constant power. Finally, a practical strategy was proposed to mitigate the performance degradation in the realistic cell operations, extending overall cell lifetime. •Numerical analysis of SOFC performance degradation caused by delamination/cracking.•Simulate performance with levels of interface delamination/active layer crack.•Quantify the effects of delamination and crack at various working conditions.•Analyze local current density distributions under three different operating modes.•Propose a strategy to extend the cell life with detections of delamination/crack.
ISSN:0360-3199
1879-3487
DOI:10.1016/j.ijhydene.2022.09.194