Depth‐resolved Laue microdiffraction with coded apertures

A rapid data acquisition and reconstruction method is introduced to image the crystalline structure of materials and the associated strain and orientations at micrometre resolution using Laue diffraction. The method relies on scanning a coded aperture across the diffracted X‐ray beam from broadband...

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Bibliographic Details
Published in:Journal of applied crystallography 2022-10, Vol.55 (5), p.1104-1110
Main Authors: Gürsoy, Doğa, Sheyfer, Dina, Wojcik, Michael, Liu, Wenjun, Tischler, Jonathan Z.
Format: Article
Language:English
Subjects:
Algorithms
Apertures
Broadband
coded sensing
Data acquisition
Diffraction
Illumination
Image acquisition
Image reconstruction
Laue microscopy
MATERIALS SCIENCE
X-ray diffraction
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Summary:A rapid data acquisition and reconstruction method is introduced to image the crystalline structure of materials and the associated strain and orientations at micrometre resolution using Laue diffraction. The method relies on scanning a coded aperture across the diffracted X‐ray beam from broadband illumination and a reconstruction algorithm to resolve Laue microdiffraction patterns as a function of depth along the incident illumination path. It provides rapid access to full diffraction information for sub‐micrometre volume elements in bulk materials. Both the theory and the experimental validation of this imaging approach are presented. A new Laue microdiffraction microscopy technique is introduced based on coded apertures for rapidly imaging the 3D microstructure of crystalline materials.
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S1600576722007099