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Depth‐resolved Laue microdiffraction with coded apertures
A rapid data acquisition and reconstruction method is introduced to image the crystalline structure of materials and the associated strain and orientations at micrometre resolution using Laue diffraction. The method relies on scanning a coded aperture across the diffracted X‐ray beam from broadband...
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| Published in: | Journal of applied crystallography 2022-10, Vol.55 (5), p.1104-1110 |
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| Main Authors: | , , , , |
| Format: | Article |
| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c2807-cd6599d38fe6784019b46c706bef6c79e3df028af2727494d48d966cfb98c8c13 |
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| cites | cdi_FETCH-LOGICAL-c2807-cd6599d38fe6784019b46c706bef6c79e3df028af2727494d48d966cfb98c8c13 |
| container_end_page | 1110 |
| container_issue | 5 |
| container_start_page | 1104 |
| container_title | Journal of applied crystallography |
| container_volume | 55 |
| creator | Gürsoy, Doğa Sheyfer, Dina Wojcik, Michael Liu, Wenjun Tischler, Jonathan Z. |
| description | A rapid data acquisition and reconstruction method is introduced to image the crystalline structure of materials and the associated strain and orientations at micrometre resolution using Laue diffraction. The method relies on scanning a coded aperture across the diffracted X‐ray beam from broadband illumination and a reconstruction algorithm to resolve Laue microdiffraction patterns as a function of depth along the incident illumination path. It provides rapid access to full diffraction information for sub‐micrometre volume elements in bulk materials. Both the theory and the experimental validation of this imaging approach are presented.
A new Laue microdiffraction microscopy technique is introduced based on coded apertures for rapidly imaging the 3D microstructure of crystalline materials. |
| doi_str_mv | 10.1107/S1600576722007099 |
| format | article |
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A new Laue microdiffraction microscopy technique is introduced based on coded apertures for rapidly imaging the 3D microstructure of crystalline materials.</description><subject>Algorithms</subject><subject>Apertures</subject><subject>Broadband</subject><subject>coded sensing</subject><subject>Data acquisition</subject><subject>Diffraction</subject><subject>Illumination</subject><subject>Image acquisition</subject><subject>Image reconstruction</subject><subject>Laue microscopy</subject><subject>MATERIALS SCIENCE</subject><subject>X-ray diffraction</subject><issn>1600-5767</issn><issn>0021-8898</issn><issn>1600-5767</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNqFkMtOwzAQRS0EEqXwAewiWAfGTmrHYgXlrQokHmsr9UN1VeJgO1Td8Ql8I1-CQ1kgsWB1R1fnjuYOQvsYjjAGdvyIKcCIUUYIAAPON9Cgt_Le2_w1b6OdEOYAuEcH6ORct3H2-f7hdXCLN62ySd3p7MVK75Q1xtcyWtdkSxtnmXQqAXWrfewSv4u2TL0Ieu9Hh-j58uJpfJ1P7q9uxqeTXJIKWC4VHXGuispoyqoSMJ-WVDKgU22Scl0oA6SqDWGElbxUZaU4pdJMeSUriYshOljvdSFaEaSNWs6kaxoto8AceCqToMM11Hr32ukQxdx1vkl3ibQXk6LE3xReU6leCF4b0Xr7UvuVwCD6R4o_j0wZvs4s7UKv_g-I2_EDuTsbFYQVX_7ldUg</recordid><startdate>202210</startdate><enddate>202210</enddate><creator>Gürsoy, Doğa</creator><creator>Sheyfer, Dina</creator><creator>Wojcik, Michael</creator><creator>Liu, Wenjun</creator><creator>Tischler, Jonathan Z.</creator><general>International Union of Crystallography</general><general>Blackwell Publishing Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>OIOZB</scope><scope>OTOTI</scope><orcidid>https://orcid.org/0000-0003-1257-870X</orcidid><orcidid>https://orcid.org/0000-0001-9072-5379</orcidid><orcidid>https://orcid.org/000000031257870X</orcidid><orcidid>https://orcid.org/0000000190725379</orcidid></search><sort><creationdate>202210</creationdate><title>Depth‐resolved Laue microdiffraction with coded apertures</title><author>Gürsoy, Doğa ; Sheyfer, Dina ; Wojcik, Michael ; Liu, Wenjun ; Tischler, Jonathan Z.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2807-cd6599d38fe6784019b46c706bef6c79e3df028af2727494d48d966cfb98c8c13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Algorithms</topic><topic>Apertures</topic><topic>Broadband</topic><topic>coded sensing</topic><topic>Data acquisition</topic><topic>Diffraction</topic><topic>Illumination</topic><topic>Image acquisition</topic><topic>Image reconstruction</topic><topic>Laue microscopy</topic><topic>MATERIALS SCIENCE</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gürsoy, Doğa</creatorcontrib><creatorcontrib>Sheyfer, Dina</creatorcontrib><creatorcontrib>Wojcik, Michael</creatorcontrib><creatorcontrib>Liu, Wenjun</creatorcontrib><creatorcontrib>Tischler, Jonathan Z.</creatorcontrib><creatorcontrib>Argonne National Laboratory (ANL), Argonne, IL (United States)</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV - Hybrid</collection><collection>OSTI.GOV</collection><jtitle>Journal of applied crystallography</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Gürsoy, Doğa</au><au>Sheyfer, Dina</au><au>Wojcik, Michael</au><au>Liu, Wenjun</au><au>Tischler, Jonathan Z.</au><aucorp>Argonne National Laboratory (ANL), Argonne, IL (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Depth‐resolved Laue microdiffraction with coded apertures</atitle><jtitle>Journal of applied crystallography</jtitle><date>2022-10</date><risdate>2022</risdate><volume>55</volume><issue>5</issue><spage>1104</spage><epage>1110</epage><pages>1104-1110</pages><issn>1600-5767</issn><issn>0021-8898</issn><eissn>1600-5767</eissn><abstract>A rapid data acquisition and reconstruction method is introduced to image the crystalline structure of materials and the associated strain and orientations at micrometre resolution using Laue diffraction. The method relies on scanning a coded aperture across the diffracted X‐ray beam from broadband illumination and a reconstruction algorithm to resolve Laue microdiffraction patterns as a function of depth along the incident illumination path. It provides rapid access to full diffraction information for sub‐micrometre volume elements in bulk materials. Both the theory and the experimental validation of this imaging approach are presented.
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| fulltext | fulltext |
| identifier | ISSN: 1600-5767 |
| ispartof | Journal of applied crystallography, 2022-10, Vol.55 (5), p.1104-1110 |
| issn | 1600-5767 0021-8898 1600-5767 |
| language | eng |
| recordid | cdi_osti_scitechconnect_1909016 |
| source | Wiley-Blackwell Read & Publish Collection |
| subjects | Algorithms Apertures Broadband coded sensing Data acquisition Diffraction Illumination Image acquisition Image reconstruction Laue microscopy MATERIALS SCIENCE X-ray diffraction |
| title | Depth‐resolved Laue microdiffraction with coded apertures |
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