In Situ Raman Mapping of Si Island Electrodes and Stress Modeling as a Function of Lithiation and Size

• Published in: ACS applied materials & interfaces 2023-08, Vol.15 (34), p.40409-40418
• Main Authors: Wang, Haotian, Song, Yueming, Ferrari, Victoria Castagna, Kim, Nam Soo, Lee, Sang Bok, Albertus, Paul, Rubloff, Gary, Stewart, David Murdock
• Format: Article
• Language: English
• Subjects: confocal Raman spectroscopy; critical size effect; ECM coupling; electrodes; ENERGY STORAGE; Energy, Environmental, and Catalysis Applications; in situ stress measurement; lithiation; oxides; Si electrode; stress; thin films; tungsten oxide lithiation
• ISSN: 1944-8244; 1944-8252
• DOI: 10.1021/acsami.3c06287

Si is known for cracking and delamination during electrochemical cycling of a battery due to the large volume change associated with Li insertion and extraction. However, it has been found experimentally that patterned Si island electrodes that are 200 nm thick and less than 7 μm wide can deform in a purely elastic manner. Inspired by this, we performed in situ Raman stress characterization of model poly-crystalline Si island electrodes using an electrochemical cell coupled with an immersion objective lens and designed for a short working distance. A 5 μm wide Si island electrode showed a parabolic stress profile during lithiation, while for a 15 μm Si island electrode, a stress plateau in the center of the electrode was observed. A continuum model with coupled electro-chemo-mechanical (ECM) physics was established to understand the stress measurement. A qualitative agreement was reached between modeling and experimental data, and the critical size effect could be explained by the Li diffusive flux as governed by competition between the Li concentration and hydrostatic stress gradients. Below the critical size, the stress gradient drives Li toward the edges, where the electrode volume is free to expand, while above the critical size, the stress plateau inhibits Li diffusion to the edge and forces destructive stress relief by cracking. This work represents a promising methodology for in situ characterization of ECM coupling in battery electrodes, with suggestions provided for further improvement.