Combining x-ray and optical spectroscopies in the study of dilute semiconductor nanoparticle composites

We discuss a methodology for the cooperative analysis of optical and x-ray spectroscopies to deduce the thermophysical properties of dilute suspensions of semiconductor nanoparticles in a wide band gap host. X-ray spectroscopy is used to determine concentration and bonding of selected elements. Reso...

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Bibliographic Details
Published in:Journal of applied physics 2000-04, Vol.87 (8), p.3850-3857
Main Authors: Persans, P. D., Lurio, L. B., Pant, J., Yükselici, H., Lian, G., Hayes, T. M.
Format: Article
Language:English
Subjects:
ABSORPTION SPECTRA
BOROSILICATE GLASS
CADMIUM SULFIDES
CHEMICAL BONDS
DOPED MATERIALS
EXPERIMENTAL DATA
MATERIALS SCIENCE
PARTICLE SIZE
RAMAN SPECTROSCOPY
SUSPENSIONS
X-RAY SPECTROSCOPY
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Summary:We discuss a methodology for the cooperative analysis of optical and x-ray spectroscopies to deduce the thermophysical properties of dilute suspensions of semiconductor nanoparticles in a wide band gap host. X-ray spectroscopy is used to determine concentration and bonding of selected elements. Resonant Raman spectroscopy establishes limits on composition and strain in particles. Analysis of optical absorption, with constraints provided by x-ray and Raman measurements, yields the particle size distribution and concentration. As an example of this approach, we study borosilicate glasses doped with ∼0.1 wt% CdS and heat treated to produce nanoparticles.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.372424