Soft-x-ray Kossel structures from W/C multilayers under various electron ionization conditions

The intensity of the W M{alpha} line emitted by tungsten present in W/C multilayer interferential mirrors (MIM) under electron excitation is studied as a function of the detection angle of the photons. The measurements are performed for various incident-electron energies and several numbers of bilay...

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Bibliographic Details
Published in:Physical review. A, Atomic, molecular, and optical physics Atomic, molecular, and optical physics, 2003-09, Vol.68 (3), Article 032505
Main Authors: Jonnard, P., André, J.-M., Bonnelle, C., Bridou, F., Pardo, B.
Format: Article
Language:English
Subjects:
ATOMIC AND MOLECULAR PHYSICS
BRAGG REFLECTION
CARBON
DETECTION
DISTRIBUTION
ELECTRONS
EMISSION
EMISSION SPECTRA
EXCITATION
INTERFERENCE
IONIZATION
MODULATION
PHOTONS
SOFT X RADIATION
TRAVELLING WAVES
TUNGSTEN
X-RAY SPECTRA
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Summary:The intensity of the W M{alpha} line emitted by tungsten present in W/C multilayer interferential mirrors (MIM) under electron excitation is studied as a function of the detection angle of the photons. The measurements are performed for various incident-electron energies and several numbers of bilayers constituting the MIM. A spatial modulation of the x-ray intensity is observed in a domain of detection angle around the Bragg angle of the W/C multilayer for the W M{alpha} emission. The experimental results are compared to a model based on the reciprocity theorem using nonuniform ionization distributions. We suggest that the intensity modulation is due to the interferences between the forward and backward traveling waves inside the MIM.
ISSN:1050-2947
1094-1622
DOI:10.1103/PhysRevA.68.032505