X-ray multiple diffraction from crystalline multilayers: Application to a 90 deg. Bragg reflection

A generalized solution to the problem of multiple-beam dynamical x-ray diffraction from single and layered crystals with vertical strain is presented. The new formalism embraces all possible diffraction geometries, including extreme cases of grazing and normal incidence and emergence. The expression...

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Bibliographic Details
Published in:Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2004-12, Vol.70 (22)
Main Authors: Souvorov, A., Ishikawa, T., Nikulin, A.Y., Stetsko, Yuri P., Chang, S.-L., Zaumseil, P., School of Physics and Materials Engineering, Monash University, Victoria 3800, National Synchrotron Radiation Research Center, Hsinchu, Taiwan, Department of Physics, National Tsing Hua University, Hsinchu, Taiwan, Institute for Semiconductor Physics, Frankfurt
Format: Article
Language:English
Subjects:
BEAMS
BRAGG REFLECTION
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
CRYSTALS
EXPERIMENTAL DATA
GEOMETRY
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MATHEMATICAL SOLUTIONS
SEMICONDUCTOR MATERIALS
SILICON
SILICON COMPOUNDS
SIMULATION
STRAINS
X RADIATION
X-RAY DIFFRACTION
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Summary:A generalized solution to the problem of multiple-beam dynamical x-ray diffraction from single and layered crystals with vertical strain is presented. The new formalism embraces all possible diffraction geometries, including extreme cases of grazing and normal incidence and emergence. The expressions for the diffracted wave amplitudes were obtained as recursion formulas. Numerical simulations were implemented and shown to be computationally stable. The formalism was successfully tested using experimental data obtained from a SiC/Si single-layered structure in a 90 deg. diffraction geometry.
ISSN:1098-0121
1550-235X
DOI:10.1103/PhysRevB.70.224109