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Prediction of ceramic stereolithography resin sensitivity from theory and measurement of diffusive photon transport
A general, quantitative relationship between the photon-transport mean free path (l*) and resin sensitivity (DP) in multiple-scattering alumina/monomer suspensions formulated for ceramic stereolithography is presented and experimentally demonstrated. A Mie-theory-based computational method with stru...
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Published in: | Journal of applied physics 2005-07, Vol.98 (2) |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | A general, quantitative relationship between the photon-transport mean free path (l*) and resin sensitivity (DP) in multiple-scattering alumina/monomer suspensions formulated for ceramic stereolithography is presented and experimentally demonstrated. A Mie-theory-based computational method with structure factor contributions to determine l* was developed. Planar-source diffuse transmittance experiments were performed on monodisperse and bimodal polystyrene/water and alumina/monomer systems to validate this computational tool. The experimental data support the application of this l* calculation method to concentrated suspensions composed of nonaggregating particles of moderately aspherical shape and log-normal size distribution. The values of DP are shown to be approximately five times that of l* in the tested ceramic stereolithography suspensions. |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.1980531 |