Absolute detection efficiency of space-based ion mass spectrometers and neutral atom imagers

Space-based ion mass spectrometers and neutral atom imagers often utilize a thin foil for generation of secondary electrons and employ a coincidence measurement between detection of the secondary electrons and detection of the primary ion or neutral atom, allowing unambiguous detection of the partic...

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Bibliographic Details
Published in:Review of scientific instruments 2005-05, Vol.76 (5)
Main Authors: Funsten, H. O., Harper, R. W., McComas, D. J.
Format: Article
Language:English
Subjects:
ATOMS
CALIBRATION
EFFICIENCY
ELECTRONS
FOILS
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ION MICROPROBE ANALYSIS
IONS
MASS SPECTROSCOPY
MONITORING
NOISE
PROBABILITY
RADIATION DETECTION
TIME-OF-FLIGHT MASS SPECTROMETERS
TIME-OF-FLIGHT METHOD
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Summary:Space-based ion mass spectrometers and neutral atom imagers often utilize a thin foil for generation of secondary electrons and employ a coincidence measurement between detection of the secondary electrons and detection of the primary ion or neutral atom, allowing unambiguous detection of the particle in a large noise background and determination of properties of the particle using time-of-flight measurement. We demonstrate a simple and straightforward method for laboratory calibration and in situ quantification and monitoring of the absolute detection probabilities of the detectors and the absolute detection efficiency of the detector subsystem without knowledge of the incident particle flux.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1889465