Simultaneous direct detection of sub keV molecular and atomic ions with a delta-doped charge-coupled device at the focal plane of a miniature mass spectrometer

A delta-doped charge-coupled device (CCD) was used for the simultaneous and direct detection of low-energy atomic and molecular ions dispersed along the focal plane of a miniature mass spectrometer (MMS). The measured detection threshold for charged particles with a delta-doped CCD has been extended...

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Bibliographic Details
Published in:Applied physics letters 2006-01, Vol.88 (4)
Main Authors: Jewell, April D., Jones, Todd J., Sinha, Mahadeva P., Nikzad, Shouleh
Format: Article
Language:English
Subjects:
ATOMIC IONS
CARBONYLS
CHARGE-COUPLED DEVICES
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
DOPED MATERIALS
EV RANGE 100-1000
IRON COMPOUNDS
MASS SPECTROMETERS
MASS SPECTROSCOPY
MOLECULAR IONS
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Summary:A delta-doped charge-coupled device (CCD) was used for the simultaneous and direct detection of low-energy atomic and molecular ions dispersed along the focal plane of a miniature mass spectrometer (MMS). The measured detection threshold for charged particles with a delta-doped CCD has been extended down to 700eV, representing over an order of magnitude improvement compared to conventional solid-state detectors. We report the direct detection of 700eV energy ions by the mass spectral measurements of species such as iron pentacarbonyl. The combination of delta-doped CCD and MMS enables high-speed, precision mass spectrometry of ions and molecules on a small scale suitable for field and space applications.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2166701