Mapping the local nanostructure inside a specimen by tomographic small-angle x-ray scattering

Small-angle x-ray scattering is combined with scanning microtomography to reconstruct the small-angle diffraction pattern in the direction of the tomographic rotation axis at each location on a virtual section through a specimen. These data yield information about the local nanoscale structure of th...

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Bibliographic Details
Published in:Applied physics letters 2006-04, Vol.88 (16)
Main Authors: Schroer, C. G., Kuhlmann, M., Roth, S. V., Gehrke, R., Stribeck, N., Almendarez-Camarillo, A., Lengeler, B.
Format: Article
Language:English
Subjects:
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
FIBERS
MAPPING
MOLDING
NANOSTRUCTURES
POLYMERS
ROTATION
SMALL ANGLE SCATTERING
SYMMETRY
TOMOGRAPHY
X-RAY DIFFRACTION
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Summary:Small-angle x-ray scattering is combined with scanning microtomography to reconstruct the small-angle diffraction pattern in the direction of the tomographic rotation axis at each location on a virtual section through a specimen. These data yield information about the local nanoscale structure of the sample. With rotational symmetry present in the diffraction patterns, e.g., for isotropic or fiber-textured scatterers, the full reciprocal space information in the small-angle scattering regime can be reconstructed at each location inside the specimen. The method is illustrated investigating a polymer rod made by injection molding.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2196062