Effect of Te precipitates on the performance of CdZnTe detectors

Measurements using the National Synchrotron Light Source provided a detailed comparisons of the microscale detector response and infrared microscopy images for CdZnTe Frisch-ring x-ray and gamma detectors. Analysis of the data showed conclusively that local deteriorations of the electron charge coll...

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Bibliographic Details
Published in:Applied physics letters 2006-04, Vol.88 (14), p.143515-143515-3
Main Authors: Carini, G. A., Bolotnikov, A. E., Camarda, G. S., Wright, G. W., James, R. B., Li, L.
Format: Article
Language:English
Subjects:
CADMIUM TELLURIDES
CHARGE COLLECTION
ELECTRONS
GAMMA DETECTION
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MICROSCOPY
NSLS
PRECIPITATION
SEMICONDUCTOR DETECTORS
SEMICONDUCTOR MATERIALS
SURFACE TREATMENTS
TELLURIUM
X-RAY DETECTION
ZINC TELLURIDES
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Summary:Measurements using the National Synchrotron Light Source provided a detailed comparisons of the microscale detector response and infrared microscopy images for CdZnTe Frisch-ring x-ray and gamma detectors. Analysis of the data showed conclusively that local deteriorations of the electron charge collection and x-ray device response fully correlate with the presence of Te precipitates as seen in the IR images. Effects of the surface processing conditions on the detector performance were also clearly observed.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2189912