X-ray microprobe of orbital alignment in strong-field ionized atoms

We have developed a synchrotron-based, time-resolved x-ray microprobe to investigate optical strong-field processes at intermediate intensities (10(14) - 10(15) W/cm2). This quantum-state specific probe has enabled the direct observation of orbital alignment in the residual ion produced by strong-fi...

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Bibliographic Details
Published in:Physical review letters 2006-08, Vol.97 (8), p.083601-083601, Article 083601
Main Authors: Young, L, Arms, D A, Dufresne, E M, Dunford, R W, Ederer, D L, Höhr, C, Kanter, E P, Krässig, B, Landahl, E C, Peterson, E R, Rudati, J, Santra, R, Southworth, S H
Format: Article
Language:English
Subjects:
ABSORPTION
ATOMIC AND MOLECULAR PHYSICS
ATOMS
IONIZATION
IONS
KRYPTON
L-S COUPLING
SYNCHROTRONS
TIME RESOLUTION
X RADIATION
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Summary:We have developed a synchrotron-based, time-resolved x-ray microprobe to investigate optical strong-field processes at intermediate intensities (10(14) - 10(15) W/cm2). This quantum-state specific probe has enabled the direct observation of orbital alignment in the residual ion produced by strong-field ionization of krypton atoms via resonant, polarized x-ray absorption. We found strong alignment to persist for a period long compared to the spin-orbit coupling time scale (6.2 fs). The observed degree of alignment can be explained by models that incorporate spin-orbit coupling. The methodology is applicable to a wide range of problems.
ISSN:0031-9007
1079-7114
DOI:10.1103/physrevlett.97.083601