Explosively Driven Shock Induced Damage in OFHC Copper

OFHC Cu samples were subjected to shock loading using plane wave HE lenses to produce a uniaxial Taylor wave profile (shock followed by immediate release). Upon arrival of the shock wave at the free surface of the sample, the wave is reflected and propagates back into the sample as a release wave. I...

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Bibliographic Details
Main Authors: Koller, D. D., Hixson, R. S., Gray, G. T. III, Rigg, P. A., Addessio, L. B., Cerreta, E. K., Maestas, J. D., Yablinsky, C. A.
Format: Conference Proceeding
Language:English
Subjects:
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
COPPER
DAMAGE
FAILURES
INTERFEROMETRY
LOADING
PRESSURE DEPENDENCE
SHOCK WAVES
STRESSES
SURFACES
TIME RESOLUTION
VELOCITY
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Summary:OFHC Cu samples were subjected to shock loading using plane wave HE lenses to produce a uniaxial Taylor wave profile (shock followed by immediate release). Upon arrival of the shock wave at the free surface of the sample, the wave is reflected and propagates back into the sample as a release wave. It is the interaction of initial and reflected release waves that place the material in a localized state of tension which can ultimately result in damage and possibly complete failure of the material. The peak tensile stress and its location in the material are determined by the wave shape. Damage evolution processes and localized behavior are discussed based on results from time-resolved free surface velocity (VISAR) interferometry and post shock metallurgical analysis of the soft recovered samples.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.2263393