An X-Ray Absorption Edge Detector for High-Resolution Measurement of Undulator Effective K-Parameter

The spectrum of angle-integrated undulator radiation displays a sharp edge at every harmonic photon energy. A technique utilizing this feature to measure minute changes in K-parameters of an undulator in a free-electron laser has been proposed. To date, this technique requires the use of crystal mon...

Full description

Saved in:
Bibliographic Details
Main Authors: Yang, B, Galayda, J N
Format: Conference Proceeding
Language:English
Subjects:
ABSORPTION
COMPUTERIZED SIMULATION
CRYSTALS
DESIGN
ELECTRON BEAMS
FREE ELECTRON LASERS
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MONOCHROMATORS
PHOTONS
RESOLUTION
WIGGLER MAGNETS
X RADIATION
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The spectrum of angle-integrated undulator radiation displays a sharp edge at every harmonic photon energy. A technique utilizing this feature to measure minute changes in K-parameters of an undulator in a free-electron laser has been proposed. To date, this technique requires the use of crystal monochromators as bandpass filters whose energy centroid depends on the incident angle of the x-ray beam. In this work we propose to use the absorption edge of an appropriate element as an energy-selective detector whose response is truly independent of the angle of the x-ray beam, and hence independent of electron beam direction and emittance. We will discuss the basic design concept of the detection system and illustrate its projected performance with computer simulations.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.2401446