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Roughness corrections to the Casimir force: The importance of local surface slope
This paper concentrates on a study where finite conductivity corrections are included in the theoretical description of the effects of roughness on the Casimir force. The roughness data were taken from gold films evaporated onto silicon and polysterene spheres. We conclude that for a detailed compar...
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Published in: | Applied physics letters 2007-10, Vol.91 (14), p.144108-144108-3 |
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container_end_page | 144108-3 |
container_issue | 14 |
container_start_page | 144108 |
container_title | Applied physics letters |
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creator | van Zwol, P. J. Palasantzas, G. De Hosson, J. Th. M. |
description | This paper concentrates on a study where finite conductivity corrections are included in the theoretical description of the effects of roughness on the Casimir force. The roughness data were taken from gold films evaporated onto silicon and polysterene spheres. We conclude that for a detailed comparison with experimental data, i.e., at the level of at least 5% at short separations below
200
nm
, the lateral dimensions of roughness for real films should be included in the theoretical considerations. Moreover, if the rms roughness is considerable, high local surface slopes are shown to have a significant effect on the Casimir force. |
doi_str_mv | 10.1063/1.2795795 |
format | article |
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200
nm
, the lateral dimensions of roughness for real films should be included in the theoretical considerations. Moreover, if the rms roughness is considerable, high local surface slopes are shown to have a significant effect on the Casimir force.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.2795795</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>United States: American Institute of Physics</publisher><subject>CASIMIR EFFECT ; CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ; EVAPORATION ; GOLD ; POLYSTYRENE ; ROUGHNESS ; SILICON ; THIN FILMS</subject><ispartof>Applied physics letters, 2007-10, Vol.91 (14), p.144108-144108-3</ispartof><rights>2007 American Institute of Physics</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c347t-d08aaa61d8e5b5ec66143fc7302a12e8485d92910abff7cdcc86a03bfc045ecb3</citedby><cites>FETCH-LOGICAL-c347t-d08aaa61d8e5b5ec66143fc7302a12e8485d92910abff7cdcc86a03bfc045ecb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.2795795$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,314,780,782,784,795,885,27922,27923,76153</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/21013682$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>van Zwol, P. J.</creatorcontrib><creatorcontrib>Palasantzas, G.</creatorcontrib><creatorcontrib>De Hosson, J. Th. M.</creatorcontrib><title>Roughness corrections to the Casimir force: The importance of local surface slope</title><title>Applied physics letters</title><description>This paper concentrates on a study where finite conductivity corrections are included in the theoretical description of the effects of roughness on the Casimir force. The roughness data were taken from gold films evaporated onto silicon and polysterene spheres. We conclude that for a detailed comparison with experimental data, i.e., at the level of at least 5% at short separations below
200
nm
, the lateral dimensions of roughness for real films should be included in the theoretical considerations. Moreover, if the rms roughness is considerable, high local surface slopes are shown to have a significant effect on the Casimir force.</description><subject>CASIMIR EFFECT</subject><subject>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</subject><subject>EVAPORATION</subject><subject>GOLD</subject><subject>POLYSTYRENE</subject><subject>ROUGHNESS</subject><subject>SILICON</subject><subject>THIN FILMS</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNp1kE1LAzEQhoMoWKsH_0HAk4etmWQ3m_UgSPELCqLUc8jOJjay3ZRke_Dfm9KiJ2FgmJeHF-Yh5BLYDJgUNzDjdVPlOSITYHVdCAB1TCaMMVHIpoJTcpbSVz4rLsSEvL2H7edqsClRDDFaHH0YEh0DHVeWzk3yax-pCxHtLV3myK83IY5mQEuDo31A09O0jc7kIPVhY8_JiTN9sheHPSUfjw_L-XOxeH16md8vChRlPRYdU8YYCZ2yVVtZlBJK4bAWjBvgVpWq6hreADOtczV2iEoaJlqHrMx4K6bkat8b0uh1Qj9aXGEYhvyD5sBASMUzdb2nMIaUonV6E_3axG8NTO-MadAHY5m927O7MrMT8T_8q03_aRM_Hdxz4g</recordid><startdate>20071001</startdate><enddate>20071001</enddate><creator>van Zwol, P. J.</creator><creator>Palasantzas, G.</creator><creator>De Hosson, J. Th. M.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>20071001</creationdate><title>Roughness corrections to the Casimir force: The importance of local surface slope</title><author>van Zwol, P. J. ; Palasantzas, G. ; De Hosson, J. Th. M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c347t-d08aaa61d8e5b5ec66143fc7302a12e8485d92910abff7cdcc86a03bfc045ecb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>CASIMIR EFFECT</topic><topic>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</topic><topic>EVAPORATION</topic><topic>GOLD</topic><topic>POLYSTYRENE</topic><topic>ROUGHNESS</topic><topic>SILICON</topic><topic>THIN FILMS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>van Zwol, P. J.</creatorcontrib><creatorcontrib>Palasantzas, G.</creatorcontrib><creatorcontrib>De Hosson, J. Th. M.</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>van Zwol, P. J.</au><au>Palasantzas, G.</au><au>De Hosson, J. Th. M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Roughness corrections to the Casimir force: The importance of local surface slope</atitle><jtitle>Applied physics letters</jtitle><date>2007-10-01</date><risdate>2007</risdate><volume>91</volume><issue>14</issue><spage>144108</spage><epage>144108-3</epage><pages>144108-144108-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>This paper concentrates on a study where finite conductivity corrections are included in the theoretical description of the effects of roughness on the Casimir force. The roughness data were taken from gold films evaporated onto silicon and polysterene spheres. We conclude that for a detailed comparison with experimental data, i.e., at the level of at least 5% at short separations below
200
nm
, the lateral dimensions of roughness for real films should be included in the theoretical considerations. Moreover, if the rms roughness is considerable, high local surface slopes are shown to have a significant effect on the Casimir force.</abstract><cop>United States</cop><pub>American Institute of Physics</pub><doi>10.1063/1.2795795</doi><oa>free_for_read</oa></addata></record> |
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subjects | CASIMIR EFFECT CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS EVAPORATION GOLD POLYSTYRENE ROUGHNESS SILICON THIN FILMS |
title | Roughness corrections to the Casimir force: The importance of local surface slope |
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