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Monte Carlo simulations of microchannel plate detectors. I. Steady-state voltage bias results
X-ray detectors based on straight-channel microchannel plates (MCPs) are a powerful diagnostic tool for two-dimensional, time-resolved imaging and time-resolved x-ray spectroscopy in the fields of laser-driven inertial confinement fusion and fast Z-pinch experiments. Understanding the behavior of mi...
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Published in: | Review of scientific instruments 2008-07, Vol.79 (7), p.073104-073104-7 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | X-ray detectors based on straight-channel microchannel plates (MCPs) are a powerful diagnostic tool for two-dimensional, time-resolved imaging and time-resolved x-ray spectroscopy in the fields of laser-driven inertial confinement fusion and fast Z-pinch experiments. Understanding the behavior of microchannel plates as used in such detectors is critical to understanding the data obtained. The subject of this paper is a Monte Carlo computer code we have developed to simulate the electron cascade in a MCP under a static applied voltage. Also included in the simulation is elastic reflection of low-energy electrons from the channel wall, which is important at lower voltages. When model results were compared to measured MCP sensitivities, good agreement was found. Spatial resolution simulations of MCP-based detectors were also presented and found to agree with experimental measurements. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.2949119 |