Large pyroelectric effect in undoped epitaxial Pb(Zr,Ti)O{sub 3} thin films on SrTiO{sub 3} substrates

We have studied pyroelectric and ferroelectric properties of Pb(Zr,Ti)O{sub 3} thin films grown epitaxially on SrTiO{sub 3}(001) substrates by rf magnetron sputtering. The pyroelectric coefficient was measured in the temperature range from 280 to 370 K using the Byer-Roundy method. Values as high as...

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Bibliographic Details
Published in:Applied physics letters 2008-08, Vol.93 (5)
Main Authors: Xiao Bo, Avrutin, Vitaliy, Liu Huiyong, Oezguer, Uemit, Morkoc, Hadis, Lu Changzhi
Format: Article
Language:English
Subjects:
ELECTRIC CHARGES
EPITAXY
FERROELECTRIC MATERIALS
MATERIALS SCIENCE
NANOSTRUCTURES
NEUTRON DIFFRACTION
PEROVSKITE
PIEZOELECTRICITY
POLARIZATION
PYROELECTRIC EFFECT
PZT
SPUTTERING
STRONTIUM TITANATES
SUBSTRATES
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE 0273-0400 K
THIN FILMS
X-RAY DIFFRACTION
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Summary:We have studied pyroelectric and ferroelectric properties of Pb(Zr,Ti)O{sub 3} thin films grown epitaxially on SrTiO{sub 3}(001) substrates by rf magnetron sputtering. The pyroelectric coefficient was measured in the temperature range from 280 to 370 K using the Byer-Roundy method. Values as high as 48 nC/cm{sup 2} K have been obtained at 300 K. The PZT thin films exhibited a remanent polarization of 45-58 {mu}C/cm{sup 2}. The improved pyroelectric coefficient was attributed to a high crystalline quality of the films, as revealed by x-ray diffraction that showed only (001)-oriented perovskite PZT phase and a {omega}-rocking curve full width at half maximum value as low as 4.2 arc min for 300 nm thick films.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2969778