Enhancement in sensitivity of copper sulfide thin film ammonia gas sensor: Effect of swift heavy ion irradiation

The studies are carried out on the effect of swift heavy ion (SHI) irradiation on surface morphology and electrical properties of copper sulfide ( Cu x S ) thin films with three different chemical compositions ( x values). The irradiation experiments have been carried out on Cu x S films with x = 1....

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Bibliographic Details
Published in:Journal of applied physics 2009-02, Vol.105 (4), p.043701-043701-8
Main Authors: Sagade, Abhay Abhimanyu, Sharma, Ramphal, Sulaniya, Indra
Format: Article
Language:English
Subjects:
AMMONIA
CHEMICAL COMPOSITION
COPPER SULFIDES
ELECTRIC CONDUCTIVITY
GOLD
HEAVY IONS
ION BEAMS
IRRADIATION
MATERIALS SCIENCE
MEV RANGE 10-100
MORPHOLOGY
SEMICONDUCTOR MATERIALS
SENSITIVITY
SENSORS
TEMPERATURE RANGE 0273-0400 K
THIN FILMS
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Summary:The studies are carried out on the effect of swift heavy ion (SHI) irradiation on surface morphology and electrical properties of copper sulfide ( Cu x S ) thin films with three different chemical compositions ( x values). The irradiation experiments have been carried out on Cu x S films with x = 1.4 , 1.8, and 2 by 100 MeV gold heavy ions at room temperature. These as-deposited and irradiated thin films have been used to detect ammonia gas at room temperature (300 K). The SHI irradiation treatment on x = 1.4 and 1.8 copper sulfide films enhances the sensitivity of the gas sensor. The results are discussed considering high electronic energy deposition by 100 MeV gold heavy ions in a matrix of copper sulfide.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.3053350