Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination

We present a tunable multifrequency continuous wave terahertz spectrometer based on two laser diodes, photoconductive antennas, and a coherent detection scheme. The system is employed to determine the absolute thickness of samples utilizing a proposed synthetic difference frequency method to circumv...

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Bibliographic Details
Published in:Applied physics letters 2010-04, Vol.96 (15), p.151112-151112-3
Main Authors: Scheller, Maik, Baaske, Kai, Koch, Martin
Format: Article
Language:English
Subjects:
ANTENNAS
DIMENSIONS
ELECTRICAL EQUIPMENT
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
LASERS
MEASURING INSTRUMENTS
RESOLUTION
SEMICONDUCTOR DEVICES
SEMICONDUCTOR LASERS
SOLID STATE LASERS
SPATIAL RESOLUTION
SPECTROMETERS
SPECTROSCOPY
THICKNESS
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Summary:We present a tunable multifrequency continuous wave terahertz spectrometer based on two laser diodes, photoconductive antennas, and a coherent detection scheme. The system is employed to determine the absolute thickness of samples utilizing a proposed synthetic difference frequency method to circumvent the 2 π uncertainty known from conventional photomixing systems while preserving a high spatial resolution.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.3402767