Bunch characteristics of an electron beam generated by a diamond secondary emitter amplifier

Electron bunches for high performance free electron lasers are subject to constraints on charge per bunch and pulse shape. A Diamond secondary emitter used in conjunction with a photocathode and drive laser has potential to enable a high brightness, high peak current photoinjector by increasing the...

Full description

Saved in:
Bibliographic Details
Published in:Journal of applied physics 2010-08, Vol.108 (4), p.044509-044509-12
Main Authors: Jensen, Kevin L., Yater, Joan E., Shaw, Jonathan L., Myers, Robert E., Pate, Bradford B., Butler, James E., Feygelson, Tatyana
Format: Article
Language:English
Subjects:
07 ISOTOPES AND RADIATION SOURCES
ACCELERATION
AMPLIFIERS
BEAM BUNCHING
BEAM DYNAMICS
BEAM PROFILES
BEAMS
CALCULATION METHODS
CARBON
CATHODES
DIAMONDS
DYNAMICS
EFFICIENCY
ELECTRODES
ELECTRON BEAMS
ELECTRON EMISSION
ELECTRON SOURCES
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
ELECTRONS
ELEMENTARY PARTICLES
ELEMENTS
EMISSION
FERMIONS
FREE ELECTRON LASERS
LASERS
LEPTON BEAMS
LEPTONS
MECHANICS
MINERALS
MONTE CARLO METHOD
NONMETALS
PARTICLE ACCELERATORS
PARTICLE BEAMS
PARTICLE SOURCES
PHOTOCATHODES
PULSE CIRCUITS
PULSE SHAPERS
QUANTUM EFFICIENCY
RADIATION SOURCES
SIGNAL CONDITIONERS
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Electron bunches for high performance free electron lasers are subject to constraints on charge per bunch and pulse shape. A Diamond secondary emitter used in conjunction with a photocathode and drive laser has potential to enable a high brightness, high peak current photoinjector by increasing the effective quantum efficiency of the photocathode. A theoretical characterization of the bunches so produced has been heretofore absent. Using a combination of Monte Carlo and analytical models, the shape of the bunches, their transit time, and emission time constants are determined and shown to be sensitive to the accelerating field in the diamond flake, incident beam profile, doping, and surface conditions. Methods to allow for extension to regimes of technological interest in terms of diamond thickness, external field, and primary pulse shape are given.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.3462437