Characterization of Large Grain Nb Ingot Microstructure Using EBSP Mapping and Laue Camera Methods

Large grain/single crystal Nb is currently being examined for fabricating superconducting radiofrequency (SRF) cavities as an alternative to using rolled sheet. Three ingot slices from different suppliers have been characterized and are compared. It is desirable to know the grain orientations of an...

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Bibliographic Details
Main Authors: Kang Di, Baars, Derek C., Bieler, Thomas R., Compton, Chris C.
Format: Conference Proceeding
Language:English
Subjects:
COHERENT SCATTERING
CRYSTAL STRUCTURE
CRYSTALS
DEFORMATION
DIFFRACTION
DIFFRACTION METHODS
ELECTROMAGNETIC RADIATION
ELECTRONS
ELEMENTARY PARTICLES
FERMIONS
GRAIN BOUNDARIES
GRAIN ORIENTATION
LAUE METHOD
LEPTONS
MANUFACTURING
MATERIALS SCIENCE
MICROSCOPY
MICROSTRUCTURE
MONOCRYSTALS
ORIENTATION
RADIATIONS
RADIOWAVE RADIATION
SCATTERING
STRAINS
SUPERCONDUCTORS
X-RAY DIFFRACTION
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Summary:Large grain/single crystal Nb is currently being examined for fabricating superconducting radiofrequency (SRF) cavities as an alternative to using rolled sheet. Three ingot slices from different suppliers have been characterized and are compared. It is desirable to know the grain orientations of an ingot slice before fabrication. Characterization of an ingot slice has been done using electron backscattered pattern (EBSP) orientation imaging microscopy (OIM), which requires cutting out pieces from the slice, a destructive technique. Use of a Laue camera allows nondestructive characterization of grain orientations. The OIM method was used to examine ingot slices from CBMM and Ningxia, while the Laue method was used to examine a Heraeus ingot slice. The three ingot slices are compared in terms of their crystal orientations and grain boundary misorientations, indicating no obvious commonalities. The Laue method has practical advantages over OIM for evaluating ingot slices during the manufacturing process.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.3580655