Measurement of the emission linewidth of a single-frequency semiconductor laser with a ring fibre interferometer

A simple scanning interferometer is implemented for measuring the emission linewidth of single-frequency semiconductor lasers. The free dispersion region of the interferometer is 28 MHz, the spectral resolution being 470 kHz. (laser spectroscopy)

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Bibliographic Details
Published in:Quantum electronics (Woodbury, N.Y.) N.Y.), 2011-07, Vol.41 (7), p.656-658, Article 656
Main Authors: Trikshev, A I, Kurkov, Andrei S, Tsvetkov, V B, Pyrkov, Yu N, Paramonov, V N
Format: Article
Language:English
Subjects:
EMISSION
FIBERS
FREQUENCY RANGE
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
INTERFEROMETERS
KHZ RANGE
LASER SPECTROSCOPY
LASERS
MEASURING INSTRUMENTS
MHZ RANGE
OPTICAL FIBERS
RESOLUTION
SEMICONDUCTOR DEVICES
SEMICONDUCTOR LASERS
SOLID STATE LASERS
SPECTROSCOPY
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Description
Summary:A simple scanning interferometer is implemented for measuring the emission linewidth of single-frequency semiconductor lasers. The free dispersion region of the interferometer is 28 MHz, the spectral resolution being 470 kHz. (laser spectroscopy)
ISSN:1063-7818
1468-4799
DOI:10.1070/QE2011v041n07ABEH014623