Metrology and Characterization Challenges for Emerging Research Materials and Devices

The International Technology Roadmap for Semiconductors (ITRS) Emerging Research Materials (ERM) and Emerging Research Devices (ERD) Technology Workgroups have identified materials and devices that could enable continued increases in the density and performance of future integrated circuit (IC) tech...

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Bibliographic Details
Main Authors: Garner, C. Michael, Herr, Dan, Obeng, Yaw
Format: Conference Proceeding
Language:English
Subjects:
DENSITY
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
ENGINEERING
INTEGRATED CIRCUITS
INTERFACES
MANAGEMENT
MATERIALS
MATERIALS SCIENCE
MEASURING METHODS
MEMORY DEVICES
MICROELECTRONIC CIRCUITS
OPERATION
PHYSICAL PROPERTIES
SEMICONDUCTOR MATERIALS
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Summary:The International Technology Roadmap for Semiconductors (ITRS) Emerging Research Materials (ERM) and Emerging Research Devices (ERD) Technology Workgroups have identified materials and devices that could enable continued increases in the density and performance of future integrated circuit (IC) technologies and the challenges that must be overcome; however, this will require significant advances in metrology and characterization to enable progress. New memory devices and beyond CMOS logic devices operate with new state variables (e.g., spin, redox state, etc.) and metrology and characterization techniques are needed to verify their switching mechanisms and scalability, and enable improvement of operation of these devices. Similarly, new materials and processes are needed to enable these new devices. Additionally, characterization is needed to verify that the materials and their interfaces have been fabricated with required quality and performance.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.3657864