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Controlled reversal of Co/Pt Dots for nanomagnetic logic applications

Domain reversal in perpendicular multilayer films is governed by an intrinsic distribution of anisotropy. However, control of the switching field distribution (SFD) of field-coupled, single domain Co/Pt dots is the key to building large integrated systems for nanomagnetic logic applications. In this...

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Bibliographic Details
Published in:Journal of applied physics 2012-04, Vol.111 (7), p.07A715-07A715-3
Main Authors: Breitkreutz, Stephan, Kiermaier, Josef, Vijay Karthik, Sankar, Csaba, Gyorgy, Schmitt-Landsiedel, Doris, Becherer, Markus
Format: Article
Language:English
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Summary:Domain reversal in perpendicular multilayer films is governed by an intrinsic distribution of anisotropy. However, control of the switching field distribution (SFD) of field-coupled, single domain Co/Pt dots is the key to building large integrated systems for nanomagnetic logic applications. In this work, partial Ga + focused ion beam (FIB) irradiation of single-domain Co/Pt dots is employed which locally reduces the anisotropy and renders the film-inherent SFD ineffective. Controlled reduction in the switching field compared to non-irradiated dots is achieved, depending on size and dose of irradiation. TEM images of an as-grown and irradiated Co/Pt stack show a change in morphology from distinct Co/Pt interfaces to intermixed and randomly oriented grains due to the Ga + ion impact. The presented method is highly suitable to control the switching behavior in field-coupled logic devices. Experimental results are used to demonstrate a nanomagnetic fanout operation.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.3675171