Investigation of the formation of quasicrystalline Al{sub 70}-Pd{sub 20}-Re{sub 10} phase in situ during annealing

The change in the phase composition of thin-film layered AlPdRe nanostructures during annealing, which led to the formation of a quasicrystalline layer, has been studied in situ. It is shown that the Al{sub 3}Pd phase is formed at a temperature above 260 Degree-Sign C, which transforms into the AlPd...

Full description

Saved in:
Bibliographic Details
Published in:Crystallography reports 2011-09, Vol.56 (5)
Main Authors: Makhotkin, I. A., Yakunin, S. N., Seregin, A. Yu, Shaitura, D. S., Tsetlin, M. B., Tereshchenko, E. Yu
Format: Article
Language:English
Subjects:
ALUMINIUM ALLOYS
ANNEALING
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
LAYERS
NANOSTRUCTURES
PALLADIUM ALLOYS
RHENIUM ALLOYS
TEMPERATURE RANGE 0400-1000 K
THIN FILMS
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The change in the phase composition of thin-film layered AlPdRe nanostructures during annealing, which led to the formation of a quasicrystalline layer, has been studied in situ. It is shown that the Al{sub 3}Pd phase is formed at a temperature above 260 Degree-Sign C, which transforms into the AlPd phase at 580 Degree-Sign C, and the icosahedral quasicrystalline Al-Pd-Re phase is formed at 680 Degree-Sign C.
ISSN:1063-7745
1562-689X
DOI:10.1134/S106377451105018X