Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical response

We have developed on the DIFFABS-SOLEIL beamline a biaxial tensile machine working in the synchrotron environment for in situ diffraction characterization of thin polycrystalline films mechanical response. The machine has been designed to test compliant substrates coated by the studied films under c...

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Bibliographic Details
Published in:Review of scientific instruments 2010-10, Vol.81 (10), p.103903-103903-8
Main Authors: Geandier, G., Thiaudière, D., Randriamazaoro, R. N., Chiron, R., Djaziri, S., Lamongie, B., Diot, Y., Le Bourhis, E., Renault, P. O., Goudeau, P., Bouaffad, A., Castelnau, O., Faurie, D., Hild, F.
Format: Article
Language:English
Subjects:
DESIGN
Engineering Sciences
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MATERIALS SCIENCE
MECHANICAL PROPERTIES
Mechanics
Mechanics of materials
PARTICLE ACCELERATORS
Physics
POLYCRYSTALS
STRAINS
SYNCHROTRONS
THIN FILMS
X-RAY DIFFRACTION
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Summary:We have developed on the DIFFABS-SOLEIL beamline a biaxial tensile machine working in the synchrotron environment for in situ diffraction characterization of thin polycrystalline films mechanical response. The machine has been designed to test compliant substrates coated by the studied films under controlled, applied strain field. Technological challenges comprise the sample design including fixation of the substrate ends, the related generation of a uniform strain field in the studied (central) volume, and the operations from the beamline pilot. Preliminary tests on 150 nm thick W films deposited onto polyimide cruciform substrates are presented. The obtained results for applied strains using x-ray diffraction and digital image correlation methods clearly show the full potentialities of this new setup.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.3488628