Grazing incidence wide angle x-ray scattering at the wiggler beamline BW4 of HASYLAB

• Published in: Review of scientific instruments 2010-10, Vol.81 (10), p.105105-105105
• Main Authors: Perlich, J, Rubeck, J, Botta, S, Gehrke, R, Roth, S V, Ruderer, M A, Prams, S M, Rawolle, M, Zhong, Q, Körstgens, V, Müller-Buschbaum, P
• Format: Article
• Language: English
• Subjects: CHARGE-COUPLED DEVICES; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; LENGTH; MATERIALS SCIENCE; MORPHOLOGY; POLYMERS; SMALL ANGLE SCATTERING; SURFACES; THIN FILMS; X-RAY DIFFRACTION
• ISSN: 0034-6748; 1089-7623
• DOI: 10.1063/1.3488459

We present an upgrade of the available measurement techniques at the wiggler beamline BW4 of the Hamburger Synchrotronstrahlungslabor (HASYLAB) to grazing incidence wide angle x-ray scattering (GIWAXS). GIWAXS refers to an x-ray diffraction method, which, based on the measurement geometry, is perfectly suited for the investigation of the material crystallinity of surfaces and thin films. It is shown that the overall experimental GIWAXS setup employing a movable CCD-detector provides the capability of reliable and reproducible diffraction measurements in grazing incidence geometry. Furthermore, the potential usage of an additional detector enables the simultaneous or successive measurement of GIWAXS and grazing incidence small angle x-ray scattering (GISAXS). The new capability is illustrated by the microbeam GIWAXS measurement of a thin film of the conjugated polymer poly(3-octylthiophene) (P3OT). The investigation reveals the semicrystalline nature of the P3OT film by a clear identification of the wide angle scattering reflexes up to the third order in the [100]-direction as well as the first order in the [010]-direction. The corresponding microbeam GISAXS measurement on the present morphology complements the characterization yielding the complete sample information from subnanometer up to micrometer length scales.