A time-of-flight backscattering spectrometer at the Spallation Neutron Source, BASIS

We describe the design and current performance of the backscattering silicon spectrometer (BASIS), a time-of-flight backscattering spectrometer built at the spallation neutron source (SNS) of the Oak Ridge National Laboratory (ORNL). BASIS is the first silicon-based backscattering spectrometer insta...

Full description

Saved in:
Bibliographic Details
Published in:Review of scientific instruments 2011-08, Vol.82 (8), p.085109-085109-10
Main Authors: Mamontov, E., Herwig, K. W.
Format: Article
Language:English
Subjects:
BACKSCATTERING
DESIGN
ENERGY RESOLUTION
ENERGY TRANSFER
EV RANGE
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
NEUTRON SOURCES
ORNL
PARTICLE ACCELERATORS
SILICON
SPALLATION
TIME-OF-FLIGHT METHOD
TIME-OF-FLIGHT SPECTROMETERS
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We describe the design and current performance of the backscattering silicon spectrometer (BASIS), a time-of-flight backscattering spectrometer built at the spallation neutron source (SNS) of the Oak Ridge National Laboratory (ORNL). BASIS is the first silicon-based backscattering spectrometer installed at a spallation neutron source. In addition to high intensity, it offers a high-energy resolution of about 3.5 μ eV and a large and variable energy transfer range. These ensure an excellent overlap with the dynamic ranges accessible at other inelastic spectrometers at the SNS.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.3626214