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A time-of-flight backscattering spectrometer at the Spallation Neutron Source, BASIS

We describe the design and current performance of the backscattering silicon spectrometer (BASIS), a time-of-flight backscattering spectrometer built at the spallation neutron source (SNS) of the Oak Ridge National Laboratory (ORNL). BASIS is the first silicon-based backscattering spectrometer insta...

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Published in:Review of scientific instruments 2011-08, Vol.82 (8), p.085109-085109-10
Main Authors: Mamontov, E., Herwig, K. W.
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Language:English
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description We describe the design and current performance of the backscattering silicon spectrometer (BASIS), a time-of-flight backscattering spectrometer built at the spallation neutron source (SNS) of the Oak Ridge National Laboratory (ORNL). BASIS is the first silicon-based backscattering spectrometer installed at a spallation neutron source. In addition to high intensity, it offers a high-energy resolution of about 3.5 μ eV and a large and variable energy transfer range. These ensure an excellent overlap with the dynamic ranges accessible at other inelastic spectrometers at the SNS.
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source American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list); AIP Journals (American Institute of Physics)
subjects BACKSCATTERING
DESIGN
ENERGY RESOLUTION
ENERGY TRANSFER
EV RANGE
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
NEUTRON SOURCES
ORNL
PARTICLE ACCELERATORS
SILICON
SPALLATION
TIME-OF-FLIGHT METHOD
TIME-OF-FLIGHT SPECTROMETERS
title A time-of-flight backscattering spectrometer at the Spallation Neutron Source, BASIS
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