The electron spectro-microscopy beamline at National Synchrotron Light Source II: A wide photon energy range, micro-focusing beamline for photoelectron spectro-microscopies

A comprehensive optical design for a high-resolution, high-flux, wide-energy range, micro-focused beamline working in the vacuum ultraviolet and soft x-ray photon energy range is proposed. The beamline is to provide monochromatic radiation to three photoelectron microscopes: a full-field x-ray photo...

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Bibliographic Details
Published in:Review of scientific instruments 2012-02, Vol.83 (2), p.023102-023102-8
Main Authors: Reininger, R., Hulbert, S. L., Johnson, P. D., Sadowski, J. T., Starr, D. E., Chubar, O., Valla, T., Vescovo, E.
Format: Article
Language:English
Subjects:
CYLINDERS
DESIGN
ENERGY RANGE
FOCUSING
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MICROSCOPES
MONOCHROMATIC RADIATION
NSLS
Optical design
Photoelectron spectroscopy
Photoelectrons
PHOTOEMISSION
PHOTONS
RESOLUTION
Scanning
SCANNING ELECTRON MICROSCOPY
SOFT X RADIATION
Ultraviolet
ULTRAVIOLET RADIATION
X-RAY PHOTOELECTRON SPECTROSCOPY
X-rays
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Summary:A comprehensive optical design for a high-resolution, high-flux, wide-energy range, micro-focused beamline working in the vacuum ultraviolet and soft x-ray photon energy range is proposed. The beamline is to provide monochromatic radiation to three photoelectron microscopes: a full-field x-ray photoelectron emission microscope and two scanning instruments, one dedicated to angle resolved photoemission spectroscopy (μ-ARPES) and one for ambient pressure x-ray photoelectron spectroscopy and scanning photoelectron microscopy (AP-XPS/SPEM). Microfocusing is achieved with state of the art elliptical cylinders, obtaining a spot size of 1 μm for ARPES and 0.5 μm for AP-XPS/SPEM. A detailed ray tracing analysis quantitatively evaluates the overall beamline performances.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.3681440