Comparative determination of the {alpha}/{beta} phase fraction in {alpha}+{beta}-titanium alloys using X-ray diffraction and electron microscopy

A comparison is made between the measured {alpha}/{beta} phase fractions in Ti-6246 using X-ray diffraction (XRD) and electron microscopy. Image analysis of SEM and TEM images was compared to the phase fraction estimate obtained using electron backscattered diffraction, lab and high-energy synchrotr...

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Bibliographic Details
Published in:Materials characterization 2009-11, Vol.60 (11)
Main Authors: Attallah, M.M., Zabeen, S., Cernik, R.J., Preuss, M.
Format: Article
Language:English
Subjects:
COMPARATIVE EVALUATIONS
ELECTRON DIFFRACTION
GRAIN SIZE
IMAGE PROCESSING
MATERIALS SCIENCE
PHASE STABILITY
PHASE STUDIES
SCANNING ELECTRON MICROSCOPY
SYNCHROTRON RADIATION
TEXTURE
TITANIUM ALLOYS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
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Summary:A comparison is made between the measured {alpha}/{beta} phase fractions in Ti-6246 using X-ray diffraction (XRD) and electron microscopy. Image analysis of SEM and TEM images was compared to the phase fraction estimate obtained using electron backscattered diffraction, lab and high-energy synchrotron XRD. There was a good agreement between the electron microscopic and diffraction techniques, provided that the microstructural parameters of grain size and texture are estimated correctly when using quantitative Rietveld refinement.
ISSN:1044-5803
1873-4189
DOI:10.1016/J.MATCHAR.2009.05.006